Place of Origin : New Taipei,Taiwan, Province Of China

The loaded board test probe is applied for examining the loaded circuit boards. The common testing methods for loaded boards are ICT (In-Circuit Test) and FCT (Function Test). Both methods examine the performance of components and circuit connections to detect the defective components during production. ICT and FCT ensure the loaded circuit boards’ normal operation through assessing connection performance of the testing components at the replicated environment of the future application field and