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Infrared Testing System - Product

Place of Origin : Xian,China

Product Description

Based on an advanced infrared testing system imported, various sorts of interfaces for detectors and thermal imagers are developed and integrated into a thermal imager performance evaluation system and infrared focal plane performance test system, the system is able to offer thermal image generated from infrared detections in real time and evaluate the imaging performance.
SWIR, MWIR and LWIR detectors and thermal imagers whose format is less then 1024 x 0124 can be tested.
Evaluated by aut

Physical Specification

Other Specification : Signal Transfer Function SiTF Dynamic Range 3D Noise Temporal NETD Spatial NETD Non-uniformity MTF MDTD MRTD DC Level Noise NETD D* @300K Responsivity NEI NEP Defective Pixels

Company Inforamtion
Xi’an FangYuanMing Science and Technology Development Co,
[ Exporter - China ]
 : Building D, No. 59 Keji 1 Road, Xi'an, China
 : +86-13571497418
 : yewei@fy-ic.com
 : Gary Ye
 : 0086-29-88238203
 : yewei@fy-ic.com
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