Non-Destructive XRF Gold Tester - Product
Place of Origin : Shenzhen,China
Delivery Time : 7 Days After Payment
Product Description
Quick Detail:
EXF 9600U is an excellent precious gold tester integrated an inbuilt computer with high industrial motherboard and multi- point hand touch.
Non-Destructive XRF Gold Tester
Competitive Advantage:
1, Inbuilt industrial motherboard & multi-point hand touch
2, Precision: 10ppm~0.1%
3, High Voltage protection
4, X-ray Tube overheating protection
5, Extension wire and the auxiliary bracket
6, Internal Printer
7, Buck-boost pre-boot
Physical Specification
Other Specification :
Quick Detail:
EXF 9600U Is An Excellent Precious Gold Tester Integrated An Inbuilt Computer With High Industrial Motherboard And Multi- Point Hand Touch.
Non-Destructive XRF Gold Tester
Competitive Advantage:
1, Inbuilt Industrial Motherboard & Multi-point Hand Touch
2, Precision: 10ppm~0.1%
3, High Voltage Protection
4, X-ray Tube Overheating Protection
5, Extension Wire And The Auxiliary Bracket
6, Internal Printer
7, Buck-boost Pre-boot
8, Active Radiation Protection
9, Stable Software System, Warm-up And Anti-interference Procedure Is Controlled By The Program, To Reduce The Interference By Thereflected X-ray And The Spectrums, To Improve The Accuracy And Stability.
Description:
EXF9600U Can Provide Customers Higher Accuracy And Precision.
EXF 9600U With Si-pin Detector Delivers Wide Elemental Coverage With An Easy-to-learn Software. Non-destructively Analyze From Sodium (Na) Through Uranium (U) In Powders, Liquids And Solids.
It Is Designed Exactly To Security Standards With Active Radiation Protection, High Voltage Protection And X-ray Tube Overheating Protection.
Malfunction Analyze.
Low Cost With Unmatched Performance-to-price Ratio.
Applications:
Fast, Precise And Non-destructive Metal Testing For Jewellery Retailers, Jewellery Manufacturers, Precious Metal Refineries, Pawn Shops, Government Quality Inspection Departments, Banks, Laboratories And Tertiary Institutions.
Specifications:
- - - -
Working Principle | Energy Dispersive X-ray Fluorescence |
Size(mm) | 670*400*330 |
Detection Limit | 100ppm Best Substance Effect |
Precision | 10ppm~0.1% |
Expanded Uncertainty | 0.19% |
Operating Environment | Temperature -11~46 Humidity 70% |
High Voltage | 0~50KV/0~1MA |
Detector | Si-Pin145Kev5 |
Testable Elements | Any 20 Elements From Whole Elements (Na~U) |