High Configuration Gate Electronic Universal Testing Machine, Non Destructive Testing Equipment - Product

Other Specification : High Configuration Gate Electronic Universal Testing Machine, Non Destructive Testing Equipment MDW-E Microcomputer Control Electronic Universal Testing Machine(High Configuration Gate Type) Description: Series MDW-E Microcomputer Control Electronic Universal Testing Machine Is Applicable For Tensile Tests Of Material Like Rubber, Plastic, Textile, Waterproofing Material, Cable, Network Wire, Metal Wire, Metal Rod, Metal Plate And Others. With Attaching Tools, It Can Also Do Compression And Bending Tests. Applications: Auto-calibration: The System Is Able To Automatically Achieve The Calibration Of Standards Of Displayed Values. The Big Liquid Crystal Displayer Displays The Real-time Test Force, Peak Value, Displacement, Speed, Status, Etc. Throughout The Trial Process. Breaking Judgment: When The Specimen Is Broken, Move The Beam To Automatically Stop The Test. Limit Protection: It Has Mechanical And Control Limit Protections Specifications: - - - - Main Technical Parameters | MDW-E | 10 | 20 | 50 | 100 | 200 | 300 | Structural Form | Floor Type | Maximum Testing Force (KN) | 10 | 20 | 50 | 100 | 200 | 300 | Operation Mode | Microcomputer Control (Chinese Software Operation) | Force Measuring Range | 2%-100% Of The Maximum Testing Force (0.4%-100%) | Relative Error On Indicated Values Of Testing Force | Better Than 1%of The Indicated Value ( Or0.5% Special Selection) | Error On Deformation Display | 1% (or0.5% ) | Minimum Resolution On The Testing Force | 0.01N | Precision On Beam Displacement | 1% (0.5% ) | Deformation Accuracy | Better Than 1% (0.5% Optional) | Speed Governing Range | 0.01-200mm | Testing Travel | Less Than 700 Mm (it Can Be Customized According T

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